Characterizing a Cavity with a Frequency Comb
Posted on 2006-07-01. Permanent link: http://www.rp-photonics.com/spotlight_2006_07_01b.html
Ref.: A. Schliesser, C. Gohle, T. Udem, and T. W. Hänsch, "Complete characterization of a broadband high-finesse cavity using an optical frequency comb"
The research group of the Nobel prize winner Theodor W. Hänsch has demonstrated another nice application of CEO-stabilized frequency combs. They can measure the chromatic dispersion of the elements of a high-finesse cavity with very high precision essentially by monitoring the wavelength-dependent transmission of a frequency comb through the cavity. The effect of cavity length drifts is eliminated by locking one particular cavity resonance to a comb line. The method allows them to measure the group delay dispersion of optical components over significant wavelength ranges (well above 100 nm) with r.m.s. errors of only a few fs2.
See also: frequency combs, carrier-envelope offset, dispersion, cavities, finesse
This article is a posting of the Photonics Spotlight. You may send comments and suggestions to RP Photonics Consulting GmbH. You may also link to this page, because its location is permanent. See also the Encyclopedia of Laser Physics and Technology.
