Where to Buy Laser Diode Testing Equipment and Services
Before You Buy: Learn About Laser Diode Testing Equipment and Services
Laser diodes need to be tested in various ways to ensure high reliability. Testing equipment and services include automated burn-in and life tests, as well as quick measurements of P-U-I curves. These tests ensure that laser diodes meet performance and reliability standards.
More general product categories: laser testing equipment
Related product categories: detectors and measurements, manufacturing equipment, optical components and devices, services and training, various devices
With its comprehensive resources, RP Photonics helps you to well prepare purchase decisions:
- Encyclopedia article: Laser Diode Testing
- For responsible purchase decisions: apply good practices
Some aspects to consider before buying laser diode testing equipment and services: compatibility with laser diodes, types of tests, testing time and accuracy, durability, power consumption, user interface, environmental resistance, calibration, maintenance, safety features, reliability.
Manufacturers and Other Suppliers for Laser Diode Testing Equipment and Services
7 suppliers for laser diode testing equipment and services are listed in the RP Photonics Buyer's Guide, out of which 2 present their product descriptions. Both manufacturers and distributors can be registered.
| All Suppliers | |
|---|---|
 Rue François Mitterrand Institut d'Optique d'Aquitaine 33400 Talence France |  AeroDIODE offers a reliability test system for laser diode qualification in the pulsed or continuous-wave regime. Up to 112 fully independent fibered devices can be electrically, thermally and optically tested according to several user-programmed test scenarios. |
 Your problem is our challenge – flexibility is our standard! Artifex Engineering GmbH & Co KGDortmunder Str. 16–18 26723 Emden Germany |  Artifex Engineering manufactures powerful short pulse test systems for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing thermally “naked” devices without undue thermal loading. These dedicated systems are designed for fast testing producing full LIV data sheets within 1 second. Visit our product page for more information. We look forward to your inquiry. |
| Chroma ATE Inc. | |
| ficonTEC Service GmbH | |
| Sintec Optronics Pte Ltd (HQ) | |
| VX Instruments GmbH | |
| Yelo Ltd. | |
