Products in the Category "Detectors and Measurements"
List of Product Categories
For each of the listed product categories, you find a list of suppliers (blue button), and for some of them also the corresponding encyclopedia article (red button).
Product | Suppliers | Enc |
---|---|---|
absorption spectroscopy equipment | 18 S | E |
avalanche photodiodes | 26 S | E |
autocollimators | 10 S | E |
autocorrelators | 21 S | E |
balanced photodetectors | 12 S | E |
beam characterization → laser beam characterization instruments | 30 S | E |
beam profilers | 36 S | E |
beam quality measurement devices | 24 S | E |
bit error rate testers | 6 S | E |
calibration light sources | 16 S | |
calorimeters → optical energy meters | 17 S | E |
cameras | 121 S | E |
carrier–envelope offset measurement and stabilization | 8 S | E |
CCD cameras → cameras | 121 S | E |
characterization of optics → optics characterization equipment | 10 S | |
chromatic dispersion measurement devices | 4 S | E |
CMOS cameras → cameras | 121 S | E |
coherence measurement devices | 2 S | E |
colorimeters | 13 S | E |
dispersion measurement devices → chromatic dispersion measurement devices | 4 S | E |
distance measurements with lasers | 11 S | E |
distributed sensors → fiber-optic sensors | 58 S | E |
dual-segment photodiodes → position-sensitive detectors | 14 S | E |
electro-optic sampling systems | 3 S | E |
ellipsometers | 5 S | |
Fabry–Perot interferometers | 13 S | E |
fiber-optic gyroscopes | 8 S | |
fiber-optic loss testers → optical loss testers | 10 S | |
fiber-optic sensors | 58 S | E |
Fizeau interferometers | 2 S | E |
fluorescence microscopes | 20 S | E |
fluorescence spectroscopy equipment | 21 S | E |
force sensors → optical force and pressure sensors | 10 S | |
frequency comb sources | 14 S | E |
frequency metrology equipment | 5 S | E |
frequency noise measurement equipment → phase noise measurement equipment | 5 S | E |
frequency-resolved optical gating devices | 13 S | E |
FROG devices → frequency-resolved optical gating devices | 13 S | E |
Gaussian beams characterization → laser beam characterization instruments | 30 S | E |
goniometers | 8 S | |
hyperspectral imaging instruments | 27 S | E |
image amplifiers → image intensifiers and image converters | 10 S | E |
image intensifiers and image converters | 10 S | E |
imaging spectrometers | 8 S | |
infrared sensor cards → laser viewing cards | 17 S | E |
image sensors | 21 S | E |
infrared cameras | 30 S | E |
infrared detectors | 19 S | E |
infrared viewers | 16 S | E |
infrared-to-visible converters | 6 S | |
intensity noise measurement equipment | 1 S | E |
interferometers | 52 S | E |
knife edge beam profilers → beam profilers | 36 S | E |
laser beam characterization instruments | 30 S | E |
laser beam profilers → beam profilers | 36 S | E |
laser diode testing equipment and services | 7 S | E |
laser distance meters → laser rangefinders | 20 S | E |
laser energy meters → optical energy meters | 17 S | E |
laser-based gas detectors | 1 S | |
laser noise measurement equipment | 4 S | E |
laser power meters → optical power meters | 68 S | E |
laser trackers | 4 S | |
laser viewing cards | 17 S | E |
laser-induced breakdown spectroscopy equipment | 16 S | |
laser-induced damage threshold measurements and equipment | 6 S | |
LED testing equipment and services | 1 S | |
line scan cameras | 15 S | |
linewidth measurement equipment | 17 S | E |
luxmeters → photometers | 22 S | E |
M2 factor → laser beam characterization instruments | 30 S | E |
Mach–Zehnder interferometers → interferometers | 52 S | E |
machine vision devices | 13 S | |
measurement and calibration services | 22 S | |
metal–semiconductor–metal photodetectors | 1 S | E |
Michelson interferometers | 3 S | E |
mid-infrared spectrometers | 15 S | E |
microchannel plate detectors | 11 S | E |
microscope cameras | 21 S | |
multiphoton microscopes → fluorescence microscopes | 20 S | E |
optical alignment systems | 4 S | |
optical inspection equipment and services | 1 S | |
optical clocks | 2 S | E |
optical damage measurements → laser-induced damage threshold measurements and equipment | 6 S | |
optical displacement sensors | 12 S | |
optical energy meters | 17 S | E |
optical force and pressure sensors | 10 S | |
optical humidity sensors | 1 S | |
optical loss testers | 10 S | |
optical metrology equipment | 55 S | E |
optical metrology services | 10 S | |
optical power monitors | 20 S | E |
optical power meters | 68 S | E |
optical pressure sensors → optical force and pressure sensors | 10 S | |
optical profilometers | 13 S | E |
optical sampling systems | 1 S | E |
optical sensing instruments | 29 S | |
optical sensors | 42 S | E |
optical spectrum analyzers | 27 S | E |
optical strain sensors | 13 S | E |
optical surface characterization equipment | 15 S | |
optical surface profilers → optical profilometers | 13 S | E |
optical temperature sensors | 15 S | E |
optical thickness sensors | 5 S | |
optical tilt sensors | 6 S | |
optical time-domain reflectometers | 23 S | E |
optical vibration sensors | 11 S | |
optics characterization equipment | 10 S | |
phase noise measurement equipment | 5 S | E |
photoacoustic gas sensing equipment | 3 S | |
photoconductive detectors | 10 S | E |
photodetectors | 119 S | E |
photodetector arrays → photodiode arrays | 8 S | E |
photodiode amplifiers | 9 S | |
photodiode arrays | 8 S | E |
photodiodes | 73 S | E |
photometers | 22 S | E |
photomultipliers | 17 S | E |
photon counting detectors | 29 S | E |
photon Doppler velocimetry equipment | 1 S | |
phototransistors | 4 S | E |
phototubes | 1 S | E |
polarimeters | 10 S | E |
polarization mode dispersion measurement and compensation equipment | 3 S | E |
position-sensitive detectors | 14 S | E |
power monitors → optical power monitors | 20 S | E |
powermeters → optical power meters | 68 S | E |
pressure sensors → optical force and pressure sensors | 10 S | |
profilometers → optical profilometers | 13 S | E |
pulse characterization instruments | 31 S | E |
pulse duration measurement devices | 23 S | E |
pump–probe measurement equipment | 9 S | E |
pyroelectric detectors → optical energy meters | 17 S | E |
p–i–n photodiodes | 14 S | E |
pyroelectric detectors | 11 S | E |
quadrant photodiodes → position-sensitive detectors | 14 S | E |
radiometers | 6 S | E |
Raman spectroscopy equipment | 61 S | E |
range finders → laser rangefinders | 20 S | E |
reference cavities | 2 S | E |
reflectometers | 6 S | E |
refractometers | 6 S | E |
scanning beam profilers → beam profilers | 36 S | E |
scintillation detectors | 9 S | |
Shack–Hartmann wavefront sensors | 9 S | E |
silicon detectors → photodiodes | 73 S | E |
solar-blind photodetectors | 5 S | E |
spectral phase interferometry instruments | 6 S | E |
spectrographs | 23 S | E |
spectrometers | 131 S | E |
spectrophotometers | 21 S | E |
spectroradiometers | 12 S | |
spectroscopy equipment | 87 S | E |
streak cameras | 7 S | E |
surface profilers → optical profilometers | 13 S | E |
terahertz cameras | 9 S | |
terahertz detectors | 26 S | E |
terahertz reflectometers | 2 S | |
terahertz spectrometers | 14 S | |
thermal imaging cameras | 16 S | E |
thermal power meters → optical power meters | 68 S | E |
thermography → thermal imaging cameras | 16 S | E |
thin-film measurement systems | 4 S | |
timing jitter measurement devices | 2 S | E |
time-of-flight measurement devices | 12 S | E |
time-resolved spectroscopy equipment | 10 S | E |
traveling-wave photodetectors → velocity-matched photodetectors | --- | E |
two-photon microscopes → fluorescence microscopes | 20 S | E |
Twyman–Green interferometers | 3 S | E |
ultraviolet sensors | 5 S | |
velocity-matched photodetectors | --- | E |
wafer testing equipment and services | 3 S | |
wavefront analyzers | 20 S | |
wavemeters | 22 S | E |
white light interferometers | 8 S | E |
X-ray detectors | 8 S |
If you miss certain product categories in our list, please contact us! We are happy to add more product terms where it is appropriate.
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