absorption spectroscopy
astrophotonics
avalanche photodiodes
autocollimators
autocorrelators
balanced photodetectors
beam characterization → laser beam characterization
beam profilers
beam quality
bit error rate testers
calibration light sources
calorimeters → optical energy meters
cameras
carrier–envelope offset measurement and stabilization
CCD cameras → cameras
characterization of optics → optics characterization
chromatic dispersion measurement
CMOS cameras → cameras
coherence measurement
colorimeters
dispersion measurement → chromatic dispersion measurement
distance measurements with lasers
distributed sensors → fiber-optic sensors
dual-segment photodiodes → position-sensitive detectors
electro-optic sampling
electronics for photodetection
ellipsometers
Fabry–Pérot interferometers
fiber analysis
fiber-optic gyroscopes
fiber-optic loss testers → optical loss testers
fiber-optic sensors
Fizeau interferometers
fluorescence microscopes
fluorescence spectroscopy
force sensors → optical force and pressure sensors
frequency comb sources
frequency metrology
frequency noise measurement → phase noise measurement
frequency-resolved optical gating
FROG → frequency-resolved optical gating
Gaussian beams characterization → laser beam characterization
goniometers
hyperspectral imaging
image amplifiers → image intensifiers and image converters
image intensifiers and image converters
imaging spectrometers
infrared sensor cards → laser viewing cards
image sensors
infrared cameras
infrared detectors
infrared viewers
infrared-to-visible converters
intensity noise measurement
interferometers
intracavity laser absorption spectroscopy
knife edge beam profilers → beam profilers
laser beam characterization
laser beam profilers → beam profilers
laser diode testing
laser distance meters → laser rangefinders
laser energy meters → optical energy meters
laser-based gas detectors
laser noise measurement
laser power meters → optical power meters
laser trackers
laser viewing cards
laser-induced breakdown spectroscopy
laser-induced damage threshold measurement
LED testing
line scan cameras
linewidth measurement
luxmeters → photometers
M 2 factor → laser beam characterization
Mach–Zehnder interferometers → interferometers
machine vision
measurement and calibration services
metal–semiconductor–metal photodetectors
Michelson interferometers
mid-infrared spectrometers
microchannel plate detectors
microscope cameras
multiphoton microscopes → fluorescence microscopes
optical alignment
optical inspection
optical clocks
optical damage measurements → laser-induced damage threshold measurement
optical displacement sensors
optical energy meters
optical force and pressure sensors
optical humidity sensors
optical loss testers
optical magnetometers
optical metrology
optical power monitors
optical power meters
optical pressure sensors → optical force and pressure sensors
optical profilometers
optical sampling
optical sensing instruments
optical sensors
optical spectrum analyzers
optical strain sensors
optical surface characterization
optical surface profilers → optical profilometers
optical temperature sensors
optical thickness sensors
optical tilt sensors
optical time-domain reflectometers
optical vibration sensors
optics characterization
phase noise measurement
photoacoustic gas sensing
photoconductive detectors
photodetectors
photodetector arrays → photodiode arrays
photodiode amplifiers
photodiode arrays
photodiodes
photometers
photomultipliers
photon counting
photon Doppler velocimetry
phototransistors
phototubes
polarimeters
polarization mode dispersion measurement and compensation
position-sensitive detectors
power monitors → optical power monitors
powermeters → optical power meters
pressure sensors → optical force and pressure sensors
profilometers → optical profilometers
pulse characterization
pulse duration measurement
pump–probe measurements
pyroelectric detectors → optical energy meters
p–i–n photodiodes
pyroelectric detectors
quadrant photodiodes → position-sensitive detectors
radiometers
Raman spectroscopy
range finders → laser rangefinders
reference cavities
reflectometers
refractive index profilers
refractometers
scanning beam profilers → beam profilers
scintillation detectors
Shack–Hartmann wavefront sensors
silicon detectors → photodiodes
silicon photomultipliers
single-photon avalanche diodes
single-photon detectors
solar-blind photodetectors
spectral phase interferometry
spectrographs
spectrometers
spectrophotometers
spectroradiometers
spectroscopy
streak cameras
surface profilers → optical profilometers
terahertz cameras
terahertz detectors
terahertz reflectometers
terahertz spectrometers
thermal imaging cameras
thermal power meters → optical power meters
thermography → thermal imaging cameras
thin-film characterization
timing jitter measurement
time-of-flight measurement
time-resolved spectroscopy
traveling-wave photodetectors → velocity-matched photodetectors
two-photon microscopes → fluorescence microscopes
Twyman–Green interferometers
ultraviolet sensors
velocity-matched photodetectors
wafer testing equipment and services
wavefront analyzers
wavemeters
white-light interferometers
X-ray detectors