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The Photonics Spotlight

Characterizing a Cavity with a Frequency Comb

Dr. Rüdiger Paschotta

Ref.: A. Schliesser, C. Gohle, T. Udem, and T. W. Hänsch, “Complete characterization of a broadband high-finesse cavity using an optical frequency comb”

The research group of the Nobel Prize winner Theodor W. Hänsch has demonstrated another nice application of CEO-stabilized frequency combs. They can measure the chromatic dispersion of the elements of a high-finesse cavity with very high precision essentially by monitoring the wavelength-dependent transmission of a frequency comb through the cavity. The effect of cavity length drifts is eliminated by locking one particular cavity resonance to a comb line. The method allows them to measure the group delay dispersion of optical components over significant wavelength ranges (well above 100 nm) with r.m.s. errors of only a few fs2.

See also: frequency combs, carrier–envelope offset, dispersion, cavities, finesse

This article is a posting of the Photonics Spotlight, authored by Dr. Rüdiger Paschotta. You may link to this page, because its location is permanent. See also the Encyclopedia of Laser Physics and Technology.

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